Showing posts with label Anritsu. Show all posts
Showing posts with label Anritsu. Show all posts

Sunday, February 28, 2021

Tektronix and Anritsu offer PCI Express 5.0 testing

Tektronix, in collaboration with Anritsu, introduced  a new PCI EXPRESS 5.0 transceiver (Base and CEM) and reference clock solution for pre-compliance testing. The collaboration between Tektronix and Anritsu enables receiver verification, complementing a world-class transmitter and reference clock test suite.

The PCI EXPRESS 5.0 Base Specification boasts bandwidth of 128 GB/s and the upcoming PCI EXPRESS 6.0 specification will push this to 256 GB/s and include multi-level PAM4 signaling.

The PCI EXPRESS 5.0 transceiver and reference clock solution from Tektronix was developed and continues to be aligned with the 5.0 Base specification, 5.0 CEM specification, and 5.0 test specifications.

Key features include:

  • PCI EXPRESS 5.0 (32 GT/s) automated Base & CEM transceiver solution running on DPO700000SX series 70 GHz real time oscilloscope and MP1900A Signal Quality Analyzer-R series (BERT) from Anritsu
  • New Receiver automation software from Tektronix with highly efficient algorithms for stressed eye calibration at 32 GT/s & 16 GT/s
  • State-of-the-art tool support including SigTest Phoenix with highly parallelized processing to reduce overall test time
  • Multiple form factors (M.2 & U.2) and Clocking Architectures (CC, SRNS, SRIS)
  • Follows real time evolution of the 5.0 Base specification with 32 GT/s uncorrelated jitter and pulse width jitter measurements implemented to optimize A/D range and minimize noise
  • Addresses the increasing challenges of 100 MHz reference clock jitter and signal integrity measurements through full integration with the Silicon Labs "PCIe Clock Jitter" tool and Tektronix's DPOJET tool
  • Industry first pre compliance test fixtures for PCIe 5.0 CEM testing

The companies note that the server/storage industry is rapidly transitioning to PCI EXPRESS 5.0 due to new requirements imposed by 400G Ethernet, cloud AI and modeling (co-processors), storage capacity, and NAND-based storage. This rapid progression brings an entirely new problem set for test and measurement traditionally split into Base silicon level validation and CEM compliance testing with the PCI-SIG.

"Electronics designers today demand future-proofing to protect their innovations' longevity into tomorrow," says Takeshi Shima, senior vice president at Anritsu corporation. "Providing a solution through Gen6 gives our customers a sense of our commitment to stay with them on the cutting edge of development."

"As PCIe becomes faster and more complex with the emergence of the Gen5 standard, engineers are faced with new design challenges, shorter time-to-market windows, new standards specifications to understand and apply, and new compliance testing requirements," says David Bouse, PCI EXPRESS systems engineer at Tektronix. "It is vital to have a comprehensive test equipment and software solution in place prior to workshop certification. Our PCIe 5.0 test and debug solution can easily guide the engineer through compliance testing and debug to ensure their design meets new standards with a high degree of confidence."

Sunday, June 28, 2020

Anritsu intros 110 GHz components for optical test equipment

Anritsu introduced components, including bias tees, a DC block, and semi-rigid cables, that operate to 110 GHz and provide broadband frequency scalability in high-frequency device characterization and optical networking applications.

The new components can be used as part of a test system consisting of 110 GHz vector network analyzers (VNAs), oscilloscopes and Bit Error Rate Testers (BERTs), as well as for optical transceivers, laser diodes, photodiodes, and optical modulators. Development of switches and routers using NRZ and PAM4 modulation schemes with 56 Gbps and 112 Gbps data rates, and 800G technology are applications, as well.

Anritsu said the addition of the new W1 components provides it with the broadest millimeter wave (mmWave) coaxial component portfolio in the market.

Tuesday, January 7, 2020

Anritsu intros Oscilloscope 53-Gbaud Clock Recovery Unit

Anritsu introduced a Clock Recovery Unit (CRU) option for its BERTWave MP2110A oscilloscope that supports trigger clock generation from a 53-Gbaud PAM4 optical signal.

When combined with existing oscilloscope functionality, the new 53-Gbaud CRU can evaluate various PAM4 optical modules during development and manufacturing compared to solutions requiring external sampling oscilloscopes.

Anritsu said it developed the 53-Gbaud CRU for the BERTWave MP2110A sampling oscilloscope to address expanding PAM4 signal analysis requirements. The solution is more economical than a sampling oscilloscope that requires a separate trigger clock signal synchronized with the data signal to conduct PAM4 measurements. This is due to the fact that optical modules outputting PAM4 signals typically do not have a trigger signal. The BERTWave MP2110A can be used by engineers to more efficiently evaluate the physical layer of 25G to 400G optical transceiver modules and equipment components, such as optical cables, used by data centers, Core/Metro networks, 4G/5G mobile backhaul, and 5G mobile fronthaul.

Wednesday, November 6, 2019

Anritsu intros 116G PAM4 error detector for 400 GbE and 800 GbE

Anritsu introduced a PAM4 Error Detector (ED) module supporting 116-Gbps bit error rate tests for its Signal Quality Analyzer-R MP1900A series.

Anritsu said its MP1900A instrument delivers error-free measurement of PAM4 signals at 116 Gbpss with industry-best operation bit rates and high Rx sensitivity performance. Combined with the previously released MP1900A series PAM4 Pattern Generator that supports high-accuracy BER measurements of PAM4 signals, the BERT allows engineers to accurately evaluate bit error rates of 400 GbE/800 GbE communications equipment and devices.

Anritsu releases 400GbE PAM4 BER Test

Anritsu announced the commercial release of its 64-Gbaud PAM4 Pulse Pattern Generator (PPG) and 32-Gbaud PAM4 Error Detector (ED) for use in 400GbE testing.

The new PAM4 BERT modules can be installed in the Anritsu Signal Quality Analyzer-R MP1900A series to implement a bit-error-rate test solution using either the 26.5625 Gbaud PAM4 x 8 lanes or 53.125- Gbaud PAM4 x 4 lanes methods. When using the PAM4 method to encode data as four amplitude levels, the gap between signal levels is one-third compared to the NRZ method, which reduces the unit time per symbol at higher baud rates, emphasizing the importance of signal quality in achieving high-speed transmissions.

Monday, September 9, 2019

Anritsu to show 116-Gbps PAM4 error detector

At the upcoming ECOC 2019 in Ireland later this month, Anritsu will host demonstrations of its new 64,2GBaud NRZ / 58,2GBaud PAM4 Error Detector for the MP1900A Signal Quality Analyzer-R. The analyzer is a high-performance Bit Error Rate Tester (BERT) that accurately measures communications equipment, next-generation high-speed electronic and optical devices, including those for M2M and IoT applications, and optical transceivers used in high-end servers.

The new 64,2GBaud NRZ / 58,2GBaud PAM4 ED card for the MP1900A Signal Quality Analyzer-R is an R&D, high-performance Error Detector supporting signal integrity evaluation on high-speed interfaces. The new ED pluggable card offers switchable NRZ and PAM4 signal analysis, high-accuracy Bit and Symbol Error Ratio measurement, world-beating PAM4 Rx Sensitivity, Clock Recovery and Equalizer.

The  first demonstration will show the new PAM4 Error Detector card combined with the existing high quality PAM4 Pulse Pattern Generator, to prove key capabilities for signal integrity and compliancy testing towards the latest standards in 200G, 400G and 800G transmission, such as MSB/LSB Bit Error Ratio and PAM4 Symbol Error Ratio, up to 58,2G Clock Recovery, 58,2GBaud PAM4 Receiver Sensitivity down to 36mV, Received Signal Equalization to compensate the impact of losses from PCBs and cables.

As an additional unique value in the market, MP1900A multichannel signal generation, combined with 25/50/100/200/400G FEC patterns emulation and jitter tolerance testing, enables accurate evaluation of the true performance of optical transceiver modules in real life working conditions.

In a second joint demonstration with Teledyne-LeCroy, the MP1900A SQA-R Platform, ready for PCIe Gen3, Gen4 and Gen5, will be shown in full automatic calibration, Rx/Tx PCIe Device testing, Link Training verification and Jitter Tolerance validation. The stressed signal calibration will be performed on a Teledyne-LeCroy LabMaster oscilloscope with a single SW tool controlling the whole test system.

Monday, February 25, 2019

Anritsu and Samsung Verify First 5G NR in Sub-6 GHz

Anritsu submitted the industry's first Protocol Conformance test in the Sub-6 GHz Frequency Range 1 (FR1) to 3GPP RAN5 working group for approval.

The test defined by 3GPP TS38.523 has been verified with the Exynos Modem 5100 5G New Radio (NR) modem developed by Samsung's System LSI Business on the Anritsu ME7834NR Protocol Conformance test system.

Anritsu offers a test platform for 3GPP-based Protocol Conformance Test (PCT) and Carrier Acceptance Testing (CAT) of mobile devices incorporating Multiple Radio Access Technologies (RAT). It supports 5G NR in both Standalone (SA) and Non-Standalone (NSA) mode, in addition to LTE, LTE-Advanced (LTE-A), LTE-A Pro, and W-CDMA. When combined with Anritsu's new OTA chamber MA8171A and RF converters, the ME7834NR covers the sub-6 GHz and millimeter wave (mmWave) 5G frequency bands.

"Anritsu continues to support our leading-edge technology development by providing quick access to the latest features on their test solutions," said Woonhaing Hur, Vice President of System LSI Protocol Development at Samsung Electronics. "5G is evolving at a much faster pace than previous technologies, and I am pleased to see that Anritsu is keeping ahead of the evolution as they did during LTE-Advanced and LTE-Advanced Pro."

"We are proud that Samsung continues to rely on our test solutions," said Mr. Tsutomu Tokuke, General Manager of Anritsu's Mobile Solutions Division. "Our collaboration with Samsung has helped us achieve yet another important industry milestone in the journey towards 5G NR commercialization."

Friday, December 7, 2018

Anritsu and Qualcomm complete 5G Standalone (SA) connection test

Anritsu and Qualcomm completed 5G Standalone (SA) connection testing between Anritsu's Radio Communication Test Station MT8000A and a mobile smartphone form-factor test device.

The testing included Qualcomm's 5G modem and antenna modules with integrated RF transceiver, RF front-end and antenna elements. The SA mode uses 5G NR technology to send and receive both data and control signalling between 5G base stations and mobile terminals. With commercial 5G NR SA services expected to start in China in 2019, there is increasing urgency to deliver a connection test environment supporting development of SA mobile terminals.

Earlier this year, the company completed joint integration testing of the 5G Non-Standalone (NSA) mode earlier this year.

Saturday, November 24, 2018

Anritsu releases 400GbE PAM4 BER Test

Anritsu announced the commercial release of its 64-Gbaud PAM4 Pulse Pattern Generator (PPG) and 32-Gbaud PAM4 Error Detector (ED) for use in 400GbE testing.

The new PAM4 BERT modules can be installed in the Anritsu Signal Quality Analyzer-R MP1900A series to implement a bit-error-rate test solution using either the 26.5625 Gbaud PAM4 x 8 lanes or 53.125- Gbaud PAM4 x 4 lanes methods. When using the PAM4 method to encode data as four amplitude levels, the gap between signal levels is one-third compared to the NRZ method, which reduces the unit time per symbol at higher baud rates, emphasizing the importance of signal quality in achieving high-speed transmissions.

Thursday, September 6, 2018

Anritsu adds 53 Gbaud upgrade for PAM4 optical signal analysis

Anritsu has released new firmware downloads for the BERTWave MP2110A Sampling Oscilloscope that boosts its PAM4 analysis function from 26 Gbaud to 53 Gbaud for the production and inspection of optical modules.

Anritsu notes that current optical modules such as CFP8s use 26-Gbaud PAM4 optical signals, while future mass-produced QSFP-DD and OSFP modules will use 53-Gbaud PAM4 optical signals. Its solution can be used to support the development and production-line inspection of next-generation QSFP-DD optical transceivers expected to be deployed in data centers.

The BERTWave MP2110A is an all-in-one measuring instrument with built-in multi-channel Bit Error Rate Tester (BERT) and Sampling Oscilloscope, supporting bit error rate (BER) measurements, Eye Mask tests, Eye pattern analyses, high sampling speed of 250 kSample/s and low-noise (3.4 μW) high-sensitivity O/E interface. The BERT and Sampling Oscilloscope are required instruments for evaluating optical modules used by optical communications systems.

As well as NRZ technology, the MP2110A also supports PAM4 signal measurements including TDECQ, which enable all-in-one quality evaluations of optical modules at speeds from 25 to 400 G. In addition, the MP2110A, thanks to its high-speed measurement and PAM4 analysis, will play a key role in improving optical module production-line productivity. Moreover, adding 53 Gbaud support for quality evaluation of next-generation optical modules helps cut capital equipment renewal costs.

Thursday, July 6, 2017

Anritsu introduces BERT tester supporting 400/200 GBE

Anritsu Company has introduced its new signal quality analyser (SQA) MP1900A BERT (bit error rate tester) that enables measurement of next-generation PCI Express Gen 4 and 5 buses, as well as the latest 400/200 Gigabit Ethernet networks.

Offering comprehensive interface support, the MP1900A solution is an all-in-one tool designed to provide accurate measurements for the next-generation, high-speed electronic and optical devices and optical transceivers utilised in high-end servers, communications equipment and optical transceivers/modules, including for M2M and IoT applications.

Anritsu's new signal quality analyser MP1900A supports simultaneous multi-channel measurements, PAM4 BER tests and PCI Express link negotiation and is designed to help engineers verify next-generation high-speed interface designs.

The SQA MP1900A BERT allows users to accurately evaluate high-speed interface designs during the early development stage. The products all-in-one extendible platform can be used to measure the performance of network-side interfaces, such as 400/200/100 Gigabit Ethernet, as well as internal PCI Express bus interfaces, and thereby help reduce design evaluation times and costs.

The solution integrates a Pulse Pattern Generator (PPG) that provides typical intrinsic jitter of 115 fs rms and typical Tr/Tf of 12 ps, while total peak-to-peak jitter is typically no more than 6 ps and typical input sensitivity for the internal error detector (ED) is 15 mV.

The solution additionally offers multiple features designed to further improve testing accuracy and efficiency, notably a link negotiation function that provides support for high-speed digital interface standards that allows connection of the MP1900A to the DUT for enhanced bus interface evaluation. Engineers can use this function to conduct PCI Express Gen 4/5 testing, LTSSM status analysis, jitter generation and CM/DM (common mode/differential mode) noise injection.

Additionally, MP1900A provides a jitter measurement function for evaluating signal integrity, while the 10Tap emphasis function and equaliser function can be utilised to characterise test signals according to transmission path loss.

Anritsu's SQA MP1900A BERT can be configured with peripheral equipment to increase measurement capabilities. Specifically, an integrated solution featuring the MP1900A can support generation of the 32 and 64 Gbaud PAM4 signals required for 200 and 400 Gigabit Ethernet measurements, BER measurements, jitter and amplitude noise injection and emphasis addition.

Saturday, November 7, 2015

Anritsu Cites Wins for LTE-A 3 Carrier Aggregation (3CA) Carrier Acceptance Test

Anritsu announced support for LTE-A 3 Carrier Aggregation (3CA) Carrier Acceptance Test (CAT) requirements at two additional major North American carriers, building on the first announcement of 3CA support for a third carrier in September.

Anritsu said it is the first test manufacturer to provide 3CA support to three large North American carriers.

Anritsu is committed to developing test solutions for the entire mobile ecosystem so the benefits of LTE-A CA, including increased data rates, can be realized. This will help ensure consumers have the best customer experience for a multitude of data applications and use cases. The ME7834LA is part of our core wireless solutions portfolio designed to address the needs of operators, device makers, and chipset manufacturers," said Paul Innis, VP and General Manager of Anritsu America Sales Region.

Sunday, July 27, 2014

Anritsu Intros All-in-one Instrument with Full OTN Mapping

Anritsu introduced an all-in-one optical field instrument with the ability to conduct Optical Transport Network (OTN) mapping of all client signals as well as multi-stage mapping in a lightweight, small portable package.

The MT1000A Network Master Pro is an all-in-one OTN tester that provides users with the capability to measure with Ethernet and SDH/SONET client signals, making it easier for technicians to install and maintain mobile and fixed-access, metro, and core transmission networks. It supports the new OTN features ODU0 and ODUflex, as well as Ethernet, Fibre Channel and SDH/SONET at rates up to 10 Gbps. Legacy PDH and DSn interfaces can also be measured with the MT1000A Network Master Pro. Field technicians can use the instrument to quickly and accurately locate and solve problems in the transport network without having to contact a remote network operations center.

"Modern networks are utilizing enhanced packet optical transport technology such as OTN to support robust, fault tolerant transport of native Ethernet- and TDM-based clients over optical meshed networks. Additionally, Fibre Channel has grown significantly to meet the demand for data center connectivity and storage area networks (SANs). Anritsu has developed the MT1000A to support the network operator, administrator, engineer, and technician who must measure existing client traffic as stand-alone native signals as well as encapsulated clients in OTN transport," said Pete Alexander, PhD, Vice President and General Manager of Anritsu Company.

Monday, January 3, 2011

Anritsu Adds Handheld Testing Support for TD-LTE

Anritsu introduced a handheld analyzer suite that measures the RF, modulation, and Over-the-Air (OTA) parameters of TD-LTE eNodeB radio transmitters. It is designed for use carriers, network equipment manufacturers, third-party contractors, and installers involved in the deployment of LTE networks.

With the TD-LTE RF Measurement option installed, the Anritsu MT822xB and MS272xC can measure channel spectrum, power vs. time, Adjacent Channel Leakage Ratio (ACLR), and Spectral Emission Mask (SEM). An RF summary can be displayed so users can view all results on the instrument's large display.