Tuesday, September 17, 2013

Anite Adds LTE-Advanced Device Testing Capabilities

Anite has added LTE-Advanced (LTE-A) Scenario Mode capability in its Development Toolset, enabling engineers to quickly develop and edit test scripts using a drag and drop graphical interface. It offers a procedure-based rather than a message-based approach to script creation, which can make test creation simpler and faster. The user creates a complete test by assembling procedure blocks without necessarily working through each message in detail.

Anite said its Development Toolset enables users to quickly validate complex lower layer test scenarios, thereby supporting the entire wireless device development lifecycle, from pre-silicon protocol module development through to systems integration and verification.

"The launch of LTE-A enabled Scenario Mode within our Development Toolset further demonstrates Anite's market leading roadmap and solution capability," says Paul Beaver, Products Director at Anite. He continues, "Supporting our chipset and device manufacturing customers with simplified and rapid testing in the early development stages will help to accelerate new devices to market."


  • Anite recently announced that it was first to release a flexible and comprehensive eICIC enriched LTE-A device testing solution, based on its Development Toolset. 

  • In February, Anite was first to announce support for industry-leading peak data rates for LTE-A Carrier Aggregation.

See also